NI PXLE-4135 oscilloscope

Brand: NI
Model:PXLE-4135
Product status: New/used
Shipping place: Xiamen, China
Warranty: 365 days
Structural form: Other (specific form may vary depending on application)
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Details

NI PXLE-4135 oscilloscope

Product manual:

NI PXIe-4135 is a high-precision system source measurement unit (SMU) launched by National Instruments Corporation (NI), designed specifically for automated testing and measurement applications.
Main features:
High precision measurement: Provides a current resolution of up to 10 fA, suitable for low current measurements.
Wide voltage range: Supports ± 200 V voltage output to meet various testing needs.
High power output: Provides up to 40 W DC power and up to 480 W pulse power, suitable for testing high-power devices.
High speed data acquisition: With a sampling rate of up to 1.8 MS/s, it supports fast data acquisition.
Modular design: Based on the PXI platform, it is convenient to integrate with other instruments and build a mixed signal testing system.
Application areas:
Semiconductor testing: used for characteristic analysis and manufacturing testing of integrated circuits (ICs), power management integrated circuits (PMICs), and radio frequency integrated circuits (RFICs).
Materials research: applicable to the study of electrical properties of materials, such as the measurement of conductivity and dielectric constant.
Optoelectronic device testing: used for performance evaluation of optoelectronic devices such as LEDs and optical transceivers.
Sensor testing: suitable for characteristic testing of low current sensors and other precision sensors.
The high precision and versatility of PXIe-4135 make it an ideal choice for various automated testing and measurement applications.