NI PXIE-4139 Source Measurement Unit

Product manual:

NI PXIe-4139 is a high-precision system source measurement unit (SMU) launched by National Instruments Corporation (NI), designed specifically for automated testing and measurement applications.
Main features:
Voltage and current range: Provides ± 60V DC voltage and ± 3A DC current to meet various testing needs.
Pulse capability: Supports a wider range of pulses, with a maximum current of ± 10A and a pulse power of 500W.
Power output: DC power output up to 20W.
Resolution: Provides high resolution of 100 fA or 100 nV to ensure accurate measurements.
Sampling rate: With a high-speed sampling rate of 1.8 MS/s, it is suitable for fast data acquisition.
Update rate: 100 kS per second, supporting fast data processing.
Technical support: Adopting NI SourceAdapt technology to achieve faster and more stable measurements.
Application areas:
Semiconductor testing: used for characteristic analysis and manufacturing testing of integrated circuits (ICs), power management integrated circuits (PMICs), and radio frequency integrated circuits (RFICs).
Materials research: applicable to the study of electrical properties of materials, such as the measurement of conductivity and dielectric constant.
Optoelectronic device testing: used for performance evaluation of optoelectronic devices such as LEDs and optical transceivers.
Sensor testing: suitable for characteristic testing of low current sensors and other precision sensors.
The high precision and versatility of PXIe-4139 make it an ideal choice for various automated testing and measurement applications.

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