Agilent HP-5517B laser interferometer

Product manual:

Agilent HP-5517B is a high-precision laser interferometer widely used in precision measurement and positioning systems. This laser interferometer is mainly used in industrial metrology, semiconductor manufacturing, optical testing, and other application fields that require high-precision measurement.
Main features:
High precision measurement:
The HP-5517B laser interferometer provides sub nanometer level accuracy, suitable for precise measurement of small displacements and changes.
Stable laser light source:
This interferometer uses a stable He Ne laser with very low frequency drift, ensuring measurement accuracy and stability during long-term operation.
Multi axis measurement capability:
Supporting multi axis measurement, it can simultaneously measure multiple dimensions, making it very suitable for complex industrial applications such as precision machining and multi axis positioning systems in semiconductor equipment.
Real time feedback:
HP-5517B can provide real-time measurement data for precise control and quick adjustment, especially in dynamic systems.
compatibility:
This model is compatible with other Agilent/HP laser interferometer systems, easy to integrate into existing measurement and control systems, and has good scalability.
Durability:
Designed to be sturdy, capable of long-term reliable operation in industrial environments, and adaptable to various complex application scenarios.
Application areas:
Semiconductor manufacturing: used for high-precision alignment and measurement in wafer manufacturing equipment.
Precision machining: Used for position feedback and calibration in CNC machine tools and precision machining equipment.
Optical component testing: used in optical systems to test and calibrate optical components such as lenses and lenses.
Metrological research: used in metrological experiments that require extremely high precision.
Main parameters:
Laser wavelength: 632.8 nm (helium neon laser).
Frequency stability: usually around ± 0.1 ppm, ensuring extremely high measurement accuracy.
Resolution: can reach sub nanometer level, suitable for applications that require extremely high precision.
Output signal: Provide standardized interference signals for easy interface and integration with other devices.

Product details picture:

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