Details
AGILENT 5517C Laser Red Interferometer
Product manual:
Main features:
High precision measurement:
The Agilent 5517C laser red interferometer uses laser interferometry technology to provide nanometer level precision measurements.
Its resolution can reach the nanometer level, suitable for precise measurement of surface morphology, displacement, vibration and other parameters.
By using the principle of interference, it is possible to accurately measure small changes on the surface of an object,
For example, thickness, shape, gap, surface contour, etc.
Laser source:
Using a red laser source (wavelength of 632.8 nm), the laser at this wavelength has high stability and accuracy,
Can provide clear and stable interference fringes, thereby ensuring high accuracy of measurement results.
The use of lasers can improve the signal strength of the system,
Ensure accurate measurement results can still be obtained in complex experimental environments.
Interference principle:
Agilent 5517C can accurately calculate small changes in the surface or displacement of an object.
Interferometers can measure surface morphology by analyzing the changes in interference fringes
The motion or displacement of an object is suitable for both dynamic and static measurements.
Technical specifications:
Laser wavelength: 632.8 nm (red laser)
Resolution: It can reach the nanometer level, and the specific resolution depends on the measurement settings and configuration.
Measurement accuracy: High precision, usually at the nanometer level, suitable for high-precision optical measurements.
Environmental adaptability: High stability design, able to work under various environmental conditions, with good anti-interference ability.
Output method: Provides multiple data output methods, including digital signal output, image output, PC interface, etc., for easy data recording and further processing.
Product details picture:
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